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SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Laser Metrology and Inspection - Spatial frequency self-filtering and brightness adaption of incoherently illuminated objects
Wagemann, Ernst U., Tiziani, Hans J., Tiziani, Hans J., Rastogi, Pramod K.Volume:
3823
Year:
1999
Language:
english
DOI:
10.1117/12.360982
File:
PDF, 2.74 MB
english, 1999