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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Detectors for Crystallography and Diffraction Studies at Synchrotron Sources - Detector array system on a single silicon chip: uniformity correction
Birkinshaw, Keith, Narayan, Dinesh J., Langstaff, David P., Greaves, G. Neville, Fraser, George W., Westbrook, Edwin M., Derbyshire, Gareth E.Volume:
3774
Year:
1999
Language:
english
DOI:
10.1117/12.367123
File:
PDF, 434 KB
english, 1999