SPIE Proceedings [SPIE Material Science and Material Properties for Infrared Optoelectronics - Kiev, Ukraine (Monday 28 September 1998)] Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics - Photoelectric properties of polycrystalline layers based on halogen-doped PbTe
Bondokov, Robert T., Dimitrov, Dimitre T., Moshnikov, Vyacheslav A., Panov, Michail F., Saunin, Igor V., Sizov, Fiodor F.Volume:
3890
Year:
1999
Language:
english
DOI:
10.1117/12.368362
File:
PDF, 318 KB
english, 1999