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SPIE Proceedings [SPIE SIOEL: Sixth Symposium of Optoelectronics - Bucharest, Romania (Wednesday 22 September 1999)] SIOEL '99: Sixth Symposium on Optoelectronics - Quality control of product/process using nondestructive control and possibilities of robotic investigation
Tanase, Letitia, Margaritescu, Mihai, Necsoiu, Teodor, Robu, Maria, Dumitras, Dan C.Volume:
4068
Year:
2000
Language:
english
DOI:
10.1117/12.378696
File:
PDF, 6.28 MB
english, 2000