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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Instruments for Optics and Optoelectronic Inspection and Control - Calibrated equipment for return loss of fiber optic passive components
Wang, Limeng, Wu, Yongsheng, Luo, Xuhui, Wei, Guang Hui, Liu, ShengVolume:
4223
Year:
2000
Language:
english
DOI:
10.1117/12.401755
File:
PDF, 94 KB
english, 2000