SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Polarization Analysis, Measurement, and Remote Sensing III - Measurements and computations of polarized marine reflectance
Fougnie, Bertrand, Frouin, Robert J., Deschamps, Pierre-Yves, Chami, Malik, Poteau, Antoine, Hagolle, Olivier, Chenault, David B., Duggin, Michael J., Egan, Walter G., Goldstein, Dennis H.Volume:
4133
Year:
2000
Language:
english
DOI:
10.1117/12.406626
File:
PDF, 288 KB
english, 2000