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SPIE Proceedings [SPIE Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering - St. Petersburg, Russia (Monday 12 June 2000)] Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering - Optimization of thermal coefficient of electrical resistivity of Co-Ti-Si thin films due to laser-induced chemical reactions
Knite, Maris, Shebanov, Leonids, Melker, Alexander I.Volume:
4348
Year:
2001
Language:
english
DOI:
10.1117/12.417662
File:
PDF, 136 KB
english, 2001