SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Flat Panel Display Technology and Display Metrology II - Quantification of specular image distinction in avionics active matrix liquid crystal display (AMLCD) applications
Wyckoff, Peter N., Ellersick, Steven D., Kelley, Edward F., Voutsas, Apostolos T.Volume:
4295
Year:
2001
Language:
english
DOI:
10.1117/12.424876
File:
PDF, 82 KB
english, 2001