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SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Three-Dimensional Image Capture and Applications IV - Dense estimation of surface reflectance parameters from registered range and color images by determining illumination conditions
Machida, Takashi, Takemura, Haruo, Yokoya, Naokazu, Corner, Brian D., Nurre, Joseph H., Pargas, Roy P.Volume:
4298
Year:
2001
Language:
english
DOI:
10.1117/12.424897
File:
PDF, 281 KB
english, 2001