SPIE Proceedings [SPIE Symposium on Integrated Optics - San...

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SPIE Proceedings [SPIE Symposium on Integrated Optics - San Jose, CA (Saturday 20 January 2001)] Testing, Reliability, and Applications of Optoelectronic Devices - Resolution enhancement using a diffraction grating for optical triangulation displacement sensors

Oh, SeBaek, Kim, Kyung-Chan, Kim, Soo Hyun, Kwak, Yoon Keun, Chin, Aland K., Dutta, Niloy K., Linden, Kurt J., Wang, S. C.
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Volume:
4285
Year:
2001
Language:
english
DOI:
10.1117/12.426875
File:
PDF, 228 KB
english, 2001
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