SPIE Proceedings [SPIE Asia-Pacific Optical and Wireless Communications Conference and Exhibit - Beijing, China (Monday 12 November 2001)] Optoelectronics, Materials, and Devices for Communications - Determining kinks for 980-nm lasers using time-resolved far-field scan
Hu, Martin H., Waters, Ron, Zah, Chung-En, Lee, Tien Pei, Wang, QimingVolume:
4580
Year:
2001
Language:
english
DOI:
10.1117/12.444920
File:
PDF, 48 KB
english, 2001