SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Surface Scattering and Diffraction for Advanced Metrology II - Analysis and characterization of surface defects in ophthalmic lenses
Pladellorens, Josep M., Caum, Jesus, Tapias, Montserrat, Cadevall, Cristina, Anto, Joan, Fernandez, Xavier, Gu, Zu-Han, Maradudin, Alexei A.Volume:
4780
Year:
2002
Language:
english
DOI:
10.1117/12.451806
File:
PDF, 475 KB
english, 2002