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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Developments in X-Ray Tomography III - Development of submicrometer resolution x-ray CT system at SPring-8
Uesugi, Kentaro, Suzuki, Yoshio, Yagi, Naoto, Tsuchiyama, Akira, Nakano, Tsukasa, Bonse, UlrichVolume:
4503
Year:
2002
Language:
english
DOI:
10.1117/12.452855
File:
PDF, 498 KB
english, 2002