SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Developments in X-Ray Tomography III - High resolution x-ray fluorescence microtomography on single sediment particles
Vincze, Laszlo, Vekemans, B., Szaloki, I., Janssens, Koen, Van Grieken, Rene, Feng, H., Jones, Keith W., Adams, Freddy, Bonse, UlrichVolume:
4503
Year:
2002
Language:
english
DOI:
10.1117/12.452865
File:
PDF, 548 KB
english, 2002