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SPIE Proceedings [SPIE Optical Data Storage - Santa Fe, NM (Sunday 22 April 2001)] Optical Data Storage 2001 - AFM length analysis of data marks: measuring jitter, asymmetry, process noise, and process position
Chernoff, Donald A., Burkhead, David L., Hurst, Terril, Kobayashi, SeijiVolume:
4342
Year:
2002
Language:
english
DOI:
10.1117/12.453421
File:
PDF, 64 KB
english, 2002