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SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II - Grayscale template-matching using finite-state machines
Waltz, Frederick M., Miller, John W. V., Harding, Kevin G., Miller, John W. V.Volume:
4567
Year:
2002
Language:
english
DOI:
10.1117/12.455247
File:
PDF, 95 KB
english, 2002