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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Infrared Technology and Applications XXVIII - Quantitative measurement of illumination invariance for face recognition using thermal infrared imagery
Wolff, Lawrence B., Socolinsky, Diego A., Eveland, Christopher K., Andresen, Bjorn, Fulop, Gabor F., Strojnik, MarijaVolume:
4820
Year:
2003
Language:
english
DOI:
10.1117/12.457626
File:
PDF, 859 KB
english, 2003