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SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Machine Vision Applications in Industrial Inspection X - Performance-scalable volumetric data classification for online industrial inspection
Abraham, Aby J., Sadki, Mustapha, Lea, R. M., Hunt, Martin A.Volume:
4664
Year:
2002
Language:
english
DOI:
10.1117/12.460203
File:
PDF, 323 KB
english, 2002