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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Interferometry XI: Applications - Specification and characterization of CGHs for interferometrical optical testing
Reichelt, Stephan, Pruss, Christof, Tiziani, Hans J., Osten, WolfgangVolume:
4778
Year:
2002
Language:
english
DOI:
10.1117/12.473540
File:
PDF, 2.36 MB
english, 2002