SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Measuring geometric parameters using image processing and diffractive optics methods
Soifer, Victor A., Kotlyar, Victor V., Khonina, Svetlana N., Khramov, Alexander G., Ilyasova, N. Y., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. HerbertVolume:
4900
Year:
2002
Language:
english
DOI:
10.1117/12.484493
File:
PDF, 836 KB
english, 2002