SPIE Proceedings [SPIE Seventh International Symposium on...

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SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Standard refractometric complex based on dynamic laser goniometer

Vishnyakov, Gennady N., Levin, Gennady G., Ziouzev, G. N., Lioudomirski, M. B., Pavlov, P. A., Filatov, Yury V., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. Herbert
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Volume:
4900
Year:
2002
Language:
english
DOI:
10.1117/12.484550
File:
PDF, 123 KB
english, 2002
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