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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Isotropic n -dimensional quadrature transform and its applications in fringe pattern processing
Quiroga, J. A., Osten, Wolfgang, Kujawinska, Malgorzata, Servin, Manuel, Marroquin, Jose L., Creath, Katherine, Gomez-Pedrero, Jose A.Volume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.499801
File:
PDF, 872 KB
english, 2003