SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Error factors of comparison in difference holographic interferometry

Fuzessy, Zoltan, Osten, Wolfgang, Kujawinska, Malgorzata, Raczkevi, Bela, Borbely, Vencel, Creath, Katherine, Gyimesi, Ferenc
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Volume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.499897
File:
PDF, 841 KB
english, 2003
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