SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Detection of defects in formed sheet metal using medial axis transformation
Murmu, Naresh C., Osten, Wolfgang, Kujawinska, Malgorzata, Velgan, Roman, Creath, KatherineVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.500529
File:
PDF, 160 KB
english, 2003