SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Virtual optical laboratory for speckle metrology
Kornis, Janos, Osten, Wolfgang, Kujawinska, Malgorzata, Creath, KatherineVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.501475
File:
PDF, 3.00 MB
english, 2003