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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Optical Manufacturing and Testing V - Three-dimensional bulk index inhomogeneity measurement using computed tomography
Stamper, Brian L., Stahl, H. Philip, Burge, James H., Dallas, William J.Volume:
5180
Year:
2003
Language:
english
DOI:
10.1117/12.504746
File:
PDF, 508 KB
english, 2003