SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - Phase-shifting algorithm via wavelength tuning based on temporal Fourier transform
Yu, Yingjie, Duparre, Angela, Singh, Bhanwar, Zhang, Benhao, Jiao, YunfangVolume:
5188
Year:
2003
Language:
english
DOI:
10.1117/12.505523
File:
PDF, 134 KB
english, 2003