SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Gradient Index, Miniature, and Diffractive Optical Systems III - Normal incidence reflective-mode etalons with novel spectral properties
Te Kolste, Robert D., Suleski, Thomas J.Volume:
5177
Year:
2003
Language:
english
DOI:
10.1117/12.510827
File:
PDF, 313 KB
english, 2003