SPIE Proceedings [SPIE San Dieg - DL Tentative - San Diego, CA (Sunday 1 July 1990)] Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection - Information extracting and application for the combining objective speckle and reflection holography
Cao, Zhengyuan, Cheng, Fang, Grover, Chander P.Volume:
1332
Year:
1991
Language:
english
DOI:
10.1117/12.51086
File:
PDF, 506 KB
english, 1991