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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - Three-dimensional reconstruction of refractive index distribution in optical phase elements by interferometric and photoelastic tomography
Kujawinska, Malgorzata, Duparre, Angela, Singh, Bhanwar, Kniazewski, PawelVolume:
5188
Year:
2003
Language:
english
DOI:
10.1117/12.512195
File:
PDF, 522 KB
english, 2003