SPIE Proceedings [SPIE Quality Control by Artificial Vision - Gatlinburg, United States (Monday 19 May 2003)] Sixth International Conference on Quality Control by Artificial Vision - Framework for industrial visual surface inspections
Silven, Olli, Tobin, Jr., Kenneth W., Meriaudeau, Fabrice, Niskanen, MattiVolume:
5132
Year:
2003
Language:
english
DOI:
10.1117/12.514928
File:
PDF, 511 KB
english, 2003