SPIE Proceedings [SPIE Optical Science and Technology,...

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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Crystals, Multilayers, and Other Synchrotron Optics - Spatially resolved tilt and strain measurements in diamond crystals

Krasnicki, Szczesny B., Ishikawa, Tetsuya, Macrander, Albert T., Zhong, Yuncheng, Maj, Jozef, Wood, James L., Macrander, Albert T.
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Volume:
5195
Year:
2003
Language:
english
DOI:
10.1117/12.516621
File:
PDF, 227 KB
english, 2003
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