SPIE Proceedings [SPIE Microelectronics, MEMS, and Nanotechnology - Perth, Australia (Tuesday 9 December 2003)] Microelectronics: Design, Technology, and Packaging - IP validation in remote microelectronics testing
Osseiran, Adam, Abbott, Derek, Eshraghian, Kamran, Eshraghian, Kamran, Lachowicz, Stefan, Musca, Charles A., Pavlidis, Dimitris, Zhao, Xiaoli, Jeffery, Roger, Weste, Neil, Robins, MichaelVolume:
5274
Year:
2003
Language:
english
DOI:
10.1117/12.523540
File:
PDF, 212 KB
english, 2003