SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Liquid Crystal Materials, Devices, and Applications X and Projection Displays X - Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry
Kjellander, B. K. Charlotte, Chien, Liang-Chy, Wu, Ming H., van IJzendoorn, Leo J., de Jong, Arthur M., Broer, Dirk J., van Gennip, Wouter J. H., de Voigt, Martien J. A., Niemantsverdriet, Hans J. W.Volume:
5289
Year:
2004
DOI:
10.1117/12.526549
File:
PDF, 285 KB
2004