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SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V - Point-by-point thorough photoresponse analysis of CMOS APS by means of our unique submicron scanning system
Shcherback, Igor, Blouke, Morley M., Sampat, Nitin, Danov, Tatiana, Belotserkovsky, Boris, Motta, Ricardo J., Yadid-Pecht, OrlyVolume:
5301
Year:
2004
Language:
english
DOI:
10.1117/12.541010
File:
PDF, 343 KB
english, 2004