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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Novel Optical Systems Design and Optimization VII - Design of an elliptical crystal spectrometer for diagnosing pulsed plasma x-ray
Zhong, Xianxin, Sasian, Jose M., Koshel, R. John, Xiong, Xiancai, Xiao, Shali, Manhart, Paul K., Juergens, Richard C., Chen, Yu, Qian, Jiayu, Gao, JieVolume:
5524
Year:
2004
Language:
english
DOI:
10.1117/12.557423
File:
PDF, 505 KB
english, 2004