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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Remote Sensing in Atmospheric Pollution Monitoring and Control - Integrated system approach at GIST/ADEMRC for monitoring atmospheric environment
Kim, Young Joon, Chu, Allen, Szykman, James, Noh, Y. M., Choi, Sung C., Lee, Chul Kyu, Jung, Jin Sang, Lee, Han L., Kim, Jeong Eun, Kim, Kyung Won, Jung, Hyun Rock, Kim, Min Jung, He, Zhuanshi, OgunjoVolume:
5547
Year:
2004
Language:
english
DOI:
10.1117/12.559211
File:
PDF, 836 KB
english, 2004