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SPIE Proceedings [SPIE Semiconductors '92 - Somerset, NJ (Sunday 22 March 1992)] Spectroscopic Characterization Techniques for Semiconductor Technology IV - Systematic optical study of InxGa1-xAs on InP using photoluminescence, photoreflectance, and micro-Raman spectroscopy
Estrera, Joseph P., Duncan, Walter M., Kao, Yung C., Liu, H. Y., Stevens, Patrick D., Beam III, E. A., Glembocki, Orest J.Volume:
1678
Year:
1992
Language:
english
DOI:
10.1117/12.60447
File:
PDF, 516 KB
english, 1992