![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Defense and Security - Orlando, Florida, USA (Monday 28 March 2005)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI - Scene-based non-uniformity correction for focal plane arrays using a facet model
Voigt, Matthias, Holst, Gerald C., Zarzycki, Martin, LeMieux, Dennis H., Ramesh, VisvanathanVolume:
5784
Year:
2005
Language:
english
DOI:
10.1117/12.605766
File:
PDF, 514 KB
english, 2005