SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

  • Main
  • SPIE Proceedings [SPIE Optical...

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Fast distance sensing by use of the speckle effect

Nippolainen, Ervin, Osten, Wolfgang, Gorecki, Christophe, Semenov, Dmitry V., Kamshilin, Alexei A., Novak, Erik L., Belyaev, Andrey V., Andreev, Sergei V., Gurevich, Boris S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.612576
File:
PDF, 266 KB
english, 2005
Conversion to is in progress
Conversion to is failed