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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Fast distance sensing by use of the speckle effect
Nippolainen, Ervin, Osten, Wolfgang, Gorecki, Christophe, Semenov, Dmitry V., Kamshilin, Alexei A., Novak, Erik L., Belyaev, Andrey V., Andreev, Sergei V., Gurevich, Boris S.Volume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.612576
File:
PDF, 266 KB
english, 2005