SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Filter radiometer based realization of photometric scale traceable to cryogenic radiometer at UME

Durak, Murat, Osten, Wolfgang, Gorecki, Christophe, Samedov, Farhad, Novak, Erik L.
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Volume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.612731
File:
PDF, 115 KB
english, 2005
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