![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Current Developments in Lens Design and Optical Engineering VI - Modeling and characterization of adaptive microlenses: focal length measurement using z-scan
Abdelaziez, Yasser A., Mouroulis, Pantazis Z., Smith, Warren J., Banerjee, Partha P., Johnson, R. BarryVolume:
5874
Year:
2005
Language:
english
DOI:
10.1117/12.617689
File:
PDF, 361 KB
english, 2005