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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Wavelets XI - Maxbeam2: a new method of identifying salient Beamlets
Edwards, Jonathan, Papadakis, Manos, Laine, Andrew F., Nicholson, Jim, O'Keefe, Simon, Unser, Michael A.Volume:
5914
Year:
2005
Language:
english
DOI:
10.1117/12.619446
File:
PDF, 287 KB
english, 2005