SPIE Proceedings [SPIE Emerging OE Technologies, Bangalore, India - Bangalore, India (Monday 16 December 1991)] Emerging Optoelectronic Technologies - Coherence length measurement by phase conjugation: a novel technique
Bhan, Chander, Rao, Kondragunta S. S., Mehta, Prakash C., Shenai, Krishna, Selvarajan, Ananth, Patel, C. K. N., Rao, C. N. R., Sonde, B. S., Tripathi, Vijai K.Volume:
1622
Year:
1992
Language:
english
DOI:
10.1117/12.637033
File:
PDF, 114 KB
english, 1992