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SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose, CA (Sunday 15 January 2006)] Machine Vision Applications in Industrial Inspection XIV - Novel view synthesis for projective texture mapping on real 3D objects
Molinier, Thierry, Meriaudeau, Fabrice, Niel, Kurt S., Fofi, David, Gorria, PatrickVolume:
6070
Year:
2006
Language:
english
DOI:
10.1117/12.642618
File:
PDF, 1.06 MB
english, 2006