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SPIE Proceedings [SPIE Nondestructive Evaulation for Health Monitoring and Diagnostics - San Diego, CA (Sunday 26 February 2006)] Testing, Reliability, and Application of Micro- and Nano-Material Systems IV - Determination of deformation fields by atomic force acoustic microscopy
Bendjus, Beatrice, Köhler, Bernd, Heuer, Henning, Rabe, Ute, Striegler, André, Geer, Robert E., Meyendorf, Norbert, Baaklini, George Y., Vogel, Dietmar W.Volume:
6175
Year:
2006
Language:
english
DOI:
10.1117/12.659016
File:
PDF, 2.08 MB
english, 2006