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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - New method of two-photon multi-layer optical disc storage
Jiang, Bing, Hou, Xun, Yuan, Jiahu, Shen, Zhaolong, Cai, Jianwen, Wyant, James C., Wang, Hexin, Tang, Huohong, Xing, Hui, Han, Sen, Huang, WenhaoVolume:
6150
Year:
2005
Language:
english
DOI:
10.1117/12.676491
File:
PDF, 235 KB
english, 2005