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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Calculation of extended bidirectional reflectance distribution function for subsurface defect scattering
Shen, Jian, Hou, Xun, Yuan, Jiahu, Liu, Shijie, Kong, Weijin, Wyant, James C., Wang, Hexin, Shen, Zicai, Shao, Jianda, Han, Sen, Fan, ZhengxiuVolume:
6150
Year:
2005
Language:
english
DOI:
10.1117/12.678595
File:
PDF, 410 KB
english, 2005