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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2007 - San Jose, CA (Saturday 20 January 2007)] Optical Components and Materials IV - Simple chromatic dispersion measurement method using a spectral interferometer
Lee, J. Y., Jiang, Shibin, Digonnet, Michel J. F., Shin, I. H., Lee, S. R., Wei, Tau., Kim, D. Y.Volume:
6469
Year:
2007
Language:
english
DOI:
10.1117/12.699955
File:
PDF, 161 KB
english, 2007