SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - Using IVI drivers to achieve instrument interchangeability
Yuan, Qingfeng, Fang, Jiancheng, Wang, Zhongyu, Qing, Honglei, Lu, HuiVolume:
6358
Year:
2006
Language:
english
DOI:
10.1117/12.717658
File:
PDF, 317 KB
english, 2006